6MHz Full-Plating Gold Electrode Crystal
Part No：AC6AF14
This product features a dual-side electrode structure that achieves excellent charge distribution symmetry. It acts like a 'stabilizer' for the crystal—even under high-stress film deposition, it evenly distributes stress, completely eliminating sudden reading jumps during monitoring and enhancing system robustness.
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Full-Plating Electrode: The Efficiency Solution for High-Throughput Scenarios
Full-plating electrode crystals adopt a dual-side full-coverage design that requires no specific orientation during installation, bringing tremendous convenience to continuous, high-volume production environments. While this design may slightly shorten the overall crystal lifespan and may produce minor oscillation mode coupling in later operation stages, its unique non-directional installation characteristic greatly improves crystal replacement efficiency in industrial production, making it a pragmatic choice for scenarios pursuing rapid deployment and high-throughput output.
Process Advantages of Dual-Side Electrodes
Exceptional Electrical Symmetry: The dual-side electrode architecture balances stress loads on both sides of the substrate, greatly reducing signal drift during monitoring and ensuring highly linear output at the 6MHz frequency. Enhanced Stress Relief Capability: Thanks to the dual-side coverage structure, this product effectively suppresses stress transfer from film growth to the quartz substrate, thereby avoiding common frequency jump phenomena during long-duration operations and substantially improving system robustness. Extremely Robust Monitoring: Even in demanding continuous evaporation environments, the dual-side design maintains exceptionally high activity, reducing 'Activity Dips' during monitoring and providing reliable assurance for production efficiency under complex processes.
Why Choose the Dual-Side 6MHz 14mm Series?
The dual-side electrode architecture maintains the standard 14mm size while solving the industry chronic problem of 'inaccurate readings' in high-stress film monitoring through structural upgrades. Its symmetrical electrical characteristics enable this crystal to demonstrate monitoring consistency far exceeding traditional single-side electrodes when dealing with ceramic materials, refractory metals, and high-density compound coatings. Whether in complex semiconductor coating processes or cutting-edge scientific thin-film research, choosing the dual-side series means choosing a stable monitoring solution capable of confidently handling complex process variables.
Product Specifications
| Part No | AC6AF14 |
| Nominal Frequency | 6.000MHz |
| Center Frequency | 5.990MHz |
| Frequency Tolerance | ±8KHz@25°C |
| Wafer Diameter | 13.97mm ± 0.03mm |
| Resonance Resistance | ≤15Ω |
| Crystal Cutting | AT-CUT |
| Electrode Material | Gold / Chrome |
| Operating Temperature | 25°C ~ 75°C |
| Electrode Appearance | Dual-Side (Full-Plating Electrode) |
| Storage Temperature | -20°C ~ +85°C |
| Storage Humidity | RH 30~50% |
| Storage Life | Unlimited storage life |
applications of the quartz monitor crystal
Find answers to the most frequently asked questions .
One major advantage of full-plating electrode crystals is 'non-directional installation'—meaning no front/back distinction is needed during installation, greatly simplifying the replacement procedure. However, please note that due to the dual-side full-coverage structure, in extremely high-stress deposition environments, ensure the sensor head clip contact points are flat. If frequency instability occurs due to excessive film stress, appropriately reduce the deposition rate to leverage the full-plating structure's stress transfer mitigation effect.
Since full-plating electrodes have metal coverage on both sides of the substrate, in certain high-stress film processes, they may indeed experience frequency drift or mode coupling slightly sooner than single-side electrodes. Therefore, they are primarily designed for applications pursuing high output efficiency and rapid crystal replacement. If you have extremely high requirements for single-crystal lifespan, we recommend evaluating process stress and comparing with our dual-anchor precision series.
Typically no instrument setting changes are required. However, since the full-plating structure alters the crystal's initial resonance parameters, we recommend performing a zeroing calibration after replacing with a full-plating crystal to ensure precise locking of the instrument to the new crystal's initial resonance frequency.
If your current process characteristics include: high crystal replacement frequency, pursuit of extremely high production operation efficiency, or monitoring of high internal-stress compound films, full-plating electrodes are your first choice. If you are conducting laboratory-grade ultra-precision thickness research with extreme pursuit of single-crystal lifespan, we recommend prioritizing our dual-anchor precision series.
First, always wear anti-static gloves during installation to avoid finger grease contamination on the electrode surface. Second, ensure the 2 anchors are correctly aligned with the sensor head slots. If frequent frequency jumps occur, this is usually due to poor installation contact or excessive substrate stress. Check installation tightness or replace the crystal promptly when the film layer becomes too thick.
The AC6AF14 crystal itself has stable material properties and is officially labeled with unlimited storage life. However, to ensure optimal performance, we recommend storing it in a dry environment of RH 30~50%. Since the electrode surface is sensitive to organic contaminants, please keep it in the original factory vacuum or anti-static packaging and avoid contact with volatile organic compounds in the air before use.
Full-plating electrodes form pressure balance on both sides of the quartz substrate through dual-side metal layers, more effectively dispersing internal stress generated during film deposition. This design significantly alleviates the squeezing effect of film stress on the crystal's central resonance region, thereby reducing reading fluctuations during high-stress film accumulation.